Identification of IGBT Bonding Wire Degradation Based on Feature Extraction and State Classification
Abstract: As a vulnerable part of insulated gate bipolar transistor, condition monitoring of bonding wires can detect potential faults at an early stage, thus avoiding threats to system safety. In ...
Abstract: To mitigate the heavy reliance on semantic information and the unreliability of manual feature extraction in dynamic simultaneous localization and mapping (SLAM) and object tracking systems, ...
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